Scanning Probe Microscope Scanning Probe Microscope

Equipment Description:
Atomic Force Microscope

Manufacturer:
Veeco Metrology, LLC
112 Robin Hill road
Santa Barbara, CA 93117

Model:
Multimode

 

 

 

 

 

General Information and Usage:

The Multimode AFM from Veeco provides a variety of high resolution surface imaging techniques. Techniques available for imaging include contact mode AFM, tapping mode AFM, Scanning Tunneling AFM, Conductive AFM, and Scanning Capacitance Microscopy. The system is fully computer controlled and resides on an optical table for vibration isolation. An additional bungee-suspension system and acoustic isolator is available for high precision measurements.

 

Equipment Specifications:

  • Conductive AFM modules for nA-microAmp current measurements
  • Tunneling AFM module for pA-nA current measurements
  • Scanning Capacitance Microscopy
  • Resolution: Sub-nm height-measurement capability; X-Y resolution tip dependent
  • Minimum substrate size: small pieces
  • Largest substrate size: 2 cm

 

Contact Information:

For additional information regarding the AFM or if you would like to inquire about using the UCSB Nanofabrication Facility, please contact This email address is being protected from spambots. You need JavaScript enabled to view it. using the telephone number or e-mail address below.

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Phone: (805) 893-8174
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