The UCSB nanofabrication facility offers a wide spectrum of tools for your research needs.

 

Listed below is a broad overview of our capabilities.

 

Remote processing is also available.

 

If you would like to investigate other processing or characterization possibilities for your project, please contact one of the following individuals to initiate the request:

Brian Thibeault:

This email address is being protected from spambots. You need JavaScript enabled to view it., (805) 893-2268

Tom Reynolds:

This email address is being protected from spambots. You need JavaScript enabled to view it., (805) 893-3918 ext. 215

 

Claudia Gutierrez:
This email address is being protected from spambots. You need JavaScript enabled to view it., (805) 893-7989

 

Lithography

E-beam Lithography: JEOL 6300FS

  • Resolution to 8 nm
  • 20 nm resolution in 500 um x 500 um field

Optical Lithography

  • Holography ≈ 200 nm
  • Projection Stepper ≈ 400 nm resolution; 150 nm registration
  • Contact Lithography (backside capability)

Nanoimprint Lithography

  • Thermal process to 200°C; 600 psi
  • UV curing
Thin Film Deposition

E-beam and Thermal Evaporation

  • Ai, Ti, Al, Au, Ni, Pd, Pt, Ag, Ge, Zn, W, Ta
  • Dielectric: SiO2, SrF, MgO, Ti O2, Ta2O5, SiO
  • Other materials are possible

PECVD

  • SiO2, SiON, Si3N4, a-Si

Sputtering

  • Si, Co, Ni, Ti, W, Au, Al, ITO, SiO2, SiN, TiO2, AlN, Al2O3
  • Other materials are possible

ALD

  • Al2O3, HfO2, ZrO2, TiO2, SiO2, AlN, HfN, TiN
Dry Etching

CH4, H2, Ar RIE

  • II-VI etching
  • III-V electronic/optoelectronic devices

SF6, CHF3, CF4, O2, Ar RIE/ICP

  • General silicon, oxide, and nitride etch
  • Separate Bosch Si etch Silicon Carbides for MEMS
  • Call about special materials.

BCl3, Cl2, SiCI4, O2 Ar RIE/ICP

  • General semiconductor and metal
  • III-V etching with heated chuck for InP
  • Call about special materials.

XeF2 etching of Silicon and Germanium

Thin Film Characterization
  • SEM: FEI Sirion, JEOL7600
  • Profilometry
  • Spectroscopic Ellipsometry
  • Reflectometry
  • Probe Station with Curve Tracer
  • 4-Point Resistivity Mapping
  • Film Stress Measurement
  • AFM

 

Other Processes
  • Contact Annealing
  • Wet Chemical Etching
  • Critical Point Drying
  • Rapid Thermal Annealing
    • 1200°C in N2, H2N2, dry air
    • III-V, Si, other materials
  • Flip-chip Bonding
  • Wafer Bonding to 600°C
  • Molecular Vapor Deposition
Other Resources

Facility users will benefit by having access to multiple labs on campus to perform their research.  The list of Mult-User Labs can be found at the following website:

 http://www.bfs.ucsb.edu/procurement/contracts-property/multi-user-lab-access

 

Equipment Status
  • IBD
    09 July 2019

    The IBD is DOWN for maintenance. The service can take up to 2 weeks to complete. Silva 11:03, 9 July 2019 (PDT)

  • E-Beam#2
    03 July 2019

    E-Beam#2 will be down July 24, 2019 until August 9, 2019 for the EBC and power supply upgrade. Silva 16:09, 3 July 2019 (PDT)

  • Suss Bonder
    12 April 2019

    Suss Bonder is DOWN. Suss field service is sourcing replacement parts for the bonder repair. An update will be sent out once we have a date scheduled for the service. Silva 10:45, 12 April 2019 (PDT)