CDE Resmap 4 Point Resistivity Mapper
CDE Resmap 178
Creative Design Engineering, Inc.
20565 Alves Drive
Cupertino, CA 95014
General Information and Usage:
The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films deposited in the facility. The system can do automated resistivity mapping for pieces to 8 inch wafers. The resistivity range is 2mOhm/Square to 5MOhm/square. Contour plots, 3D plots, histograms, data exporting are supported from the Windows XP based control system.
Phone: (805) 893-3918 ext. 217