CDE Resmap 4 Point Resistivity Mapper

CDE Resmap 4 Point Resistivity Mapper

Equipment Description:
CDE Resmap 4 Point Resistivity Mapper

Model:
CDE Resmap 178

Manufacturer:
Creative Design Engineering, Inc.
20565 Alves Drive
Cupertino, CA 95014
Telephone: 408-736-7273
www.cde-resmap.com

 

 

 

General Information and Usage:

The CDE Resmap 4 point resistivity mapper is used for measuring resistivity across the wafer for substrates and thin films deposited in the facility.  The system can do automated resistivity mapping for pieces to 8 inch wafers.  The resistivity range is 2mOhm/Square to 5MOhm/square.  Contour plots, 3D plots, histograms, data exporting are supported from the Windows XP based control system.

 

Contact Information:

For additional information regarding the CDE Resmap 4 Point Resistivity Mapper or if you would like to inquire about using the UCSB Nanofabrication Facility, please contact This email address is being protected from spambots. You need JavaScript enabled to view it.  using the telephone number or e-mail address below. 

 

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Phone: (805) 893-3918 ext. 217

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Technical and educational staff services are possible through the generosity of the National Science Foundation through support via the NNIN.